A. Youssef

Latest

• Tabula Rasa for n‐Cz silicon‐based photovoltaics
• Oxygen-related defect characterization using correlative microscopy
• Do grain boundaries matter? Electrical and elemental identification at grain boundaries in LeTID-affected p-type multicrystalline silicon
• Oxygen migration enthalpy likely limits oxide precipitate dissolution during tabula rasa
• Tabula Rasa: Oxygen precipitate dissolution though rapid high temperature processing in silicon