A.E. Morishige

Latest

• Oxygen-related defect characterization using correlative microscopy
• Do grain boundaries matter? Electrical and elemental identification at grain boundaries in LeTID-affected p-type multicrystalline silicon
• Assessing the defect responsible for LeTID: temperature- and injection-dependent lifetime spectroscopy
• Accelerating Synchrotron-Based Characterization of Solar Materials: Development of Flyscan Capability